Aeris XRD
Aeris desktop XRD from Malvern Panalytical is an ideal and affordable compact XRD for crystal structure, phase identification and phase quantitation. Aeris is available in application focussed Editions, each matched with capabilities and software for that sector.
Aeris Cement / Aeris Metals / Aeris Minerals / Aeris Research
The Aeris Cement Edition, for example directly probes the mineralogical composition of cement and its intermediates. This allows you to judge the physical properties to better control the kiln when for example using alternative fuels. Or help you produce greener and more efficient cement with strength, setting properties, hydration properties and chemical resistance of cement being directly linked to the cement mineralogy.
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Empyrean XRD
Empyrean from Malvern Panalytical is the ultimate X-ray platform for the analysis of powders, thin films, nanomaterials and solid objects. Ideal for
modern materials research, where the lifetime of an instrument is considerably longer than the horizon of any research project. Empyrean features MultiCore Optics to enable the largest variety of measurements without manual intervention. Empyrean has the unique ability to measure all sample types – from powders to thin films, from nanomaterials to solid objects – on a single instrument.
The unrivalled collection of sample stages and optical components for Empyrean allows applications to be done in various ways: from ‘simple’ by just adding a few slits and analysis software to a standard geometry, to top performance using dedicated optics, sources and detectors.
Empyrean Nano Edition is a hybrid laboratory X-ray scattering instrument for the structural characterization of (nano)materials on multiple length scales. Nano offers SAXS and WAXS: Small-and wide-angle X-ray scattering.
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Epsilon 1 ED-XRF
The Epsilon range of X-ray fluorescence instruments from Malvern Panalytical are easy to operate, compact and X-ray safe, analyzing many elements with no need for additional chemicals or operating gasses.
The Epsilon 1 is a fully integrated energy dispersive XRF analyzer with a built-in computer, touch screen and analysis software. Powered by the latest in excitation and detection technology the Epsilon 1 is a star performer in benchtop technology.
Epsilon 1 produces fast, cost-effective, precise and accurate data with minimal operator dependence and sample preparation. The total running cost is lower than analytical techniques such as AAS, ICP and wet chemical methods that are costly and also require a dedicated skilled operator.
The Epsilon 1 is a portable and safe alternative to a handheld XRF analyzer. Read the five reasons why you should consider an Epsilon 1 over a handheld XRF.
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Epsilon 4 ED-XRF
Built on the experience and success of Malvern
Panalytical’s Epsilon 3 range, the Epsilon 4 is a multi-functional benchtop XRF analyzer for any industry segment needing elemental analysis from fluorine (F) to americium (Am) in areas from R&D through to process control.
As with Aeris, Epsilon 4 is available in Editions tailored to your sample and industry needs. Featuring a removable 10 position sample carousel with a spinner option, you can choose between a low drift 10W tube or 15 W tube and with voltage settings from 4.0 to 50 kV and maximum current up to 3.0 mA to optimize the performance across the periodic table.
Building materials / Food & Environment /Lube Oils / Oils & Fuels / Mining & Minerals / Pharma & Cosmetics / Polymers & Paints
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Claisse fusion
Designed for unprecedented analytical accuracy and repeatability, Claisse® electric and gas automatic instruments set new benchmarks in sample fusion capabilities. The same is true for Claisse pre-fused and homogeneous borate fluxes, high-quality platinum ware, as well as analytical consulting services.
Claisse LeNeo fusion instrument prepares glass disks for XRF as well as borate and peroxide solutions for AA analysis and ICP analysis. It is a single position electrical instrument. While Claisse LeDoser automatic weigher is specifically designed to weigh and dispense borate flux with high precision.
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Zetium XRF
Zetium from Malvern Panalytical embodies SumXcore technology – an integration of WDXRF and EDXRF. This unique combination puts Zetium in a class of its own with respect to analytical power, speed and task flexibility.
Zetium is equipped with the latest version of our SuperQ software, including Virtual Analyst that enables even non-expert users to easily set up applications. A wide range of additional software modules is available for specific analysis, such as standardless analysis, trace elements in geology, matrix corrections in oils and analysis of thin films.
Tailored industry editions of the Zetium XRF spectrometer are offered for: cement, minerals, metals, petrochemicals and polymers & plastics. While the Ultimate edition meets the most demanding requirements regardless of industry. The modular design of the Zetium platform allows for task-oriented performance enhancements through various packages. Malvern Panalytical offers a range of integration solutions; from a simple interface with sample preparation equipment, to full automation projects integrating several analytical instruments in a single container laboratory.
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Axios FAST XRF
Malvern Panalytical Axios FAST simultaneous WDXRF spectrometer is the ideal solution when you require non-destructive chemical analysis in seconds for time-critical process control or running sample high-throughputs. 
With > 28 elements measured simultaneously in concentration ranges from ppm to 100%. Accurate and robust analysis, ease of operation by less-experienced staff and high up-time go hand in hand with a low cost of ownership.
Main application areas include steel and metals alloy production as well as geological or commercial laboratories where hundreds of samples need to be analyzed every day.
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2830 ZT
The 2830 ZT from Malvern Panalytical wavelength dispersive X-ray fluorescence (WDXRF) is a wafer analyzer that offers the ultimate capability for measuring film thickness and composition.
Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.
The 4 kW SST-mAX X-ray tube features groundbreaking ZETA technology which eliminates the effects of X-ray tube aging. This ‘new tube’ performance is maintained throughout the tube’s lifetime, and together with high sensitivity, ZETA technology ensures that rapid analysis and short measurement times are upheld throughout the tube’s lifetime. ZETA technology reduces the need for drift correction and recalibration, which increases productivity and uptime of the instrument.
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