X-Ray Fluorescence


XRF is an analytical technique that can be used to determine the chemical composition of a wide variety of sample types including solids, liquids, slurries and loose powders. This is also used to determine the thickness and composition of layers and coatings. XRF is an atomic emission method, what measures the wavelength and intensity of ‘light’ emitted by energized atoms in the sample.

Panalytical’s XRF spectrometers for elemental and thin-film thickness analysis

PANalytical’s XRF spectrometers range from energy-dispersive benchtop XRF systems to wavelength-dispersive high-performance XRF systems and niche products for semiconductor measurement. These products are suitable for a wide range of analysis and throughput requirements and operating environments. 

Each PANalytical XRF spectrometer is available with advanced and highly specialized software. This maximizes the effectiveness of the analysis that is performed with that particular XRF spectrometer or series of XRF spectrometers.


Axios FAST

Epsilon 1

Epsilon 4

2830 ZT